发明名称 Process for producing semiconductor integrated circuit
摘要 When the source and drain regions (an n- type semiconductor region and an n+ type semiconductor region) of a complementary MISFET and a p-type semiconductor region for use as a punch-through stopper are formed in a p-type well in a substrate having a p- and an n-type well, p-type impurities for the punch-through stopper are suppressed from being supplied to the feeding portion (an n+ type semiconductor region) of the n-type well.
申请公布号 US5780328(A) 申请公布日期 1998.07.14
申请号 US19970835197 申请日期 1997.04.07
申请人 HITACHI, LTD.;HITACHI ULSI ENGINEERING CO., LTD. 发明人 FUKUDA, KAZUSHI;YOSHIDA, YASUKO;HOSHINO, YUTAKA;HASHIMOTO, NAOTAKA;ASAYAMA, KYOICHIRO;KOIDE, YUUKI;YOSHIZUMI, KEIICHI;OKAMOTO, ERI;HAGA, SATORU;IKEDA, SHUJI
分类号 H01L27/088;H01L21/8234;H01L21/8238;H01L21/8239;H01L21/8244;H01L27/11;(IPC1-7):H01L21/823;H01L21/336 主分类号 H01L27/088
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