发明名称 ANALYSIS METHOD OF PROCESS DEFECT
摘要 An analysing method of process defects is provided to automatically analyze. The analysing method comprises the steps of: classifying into dot defects group, scratch defects group, diffusion defects group, high density line defects group and chemical pollution defects group in accordance with size and position of defects; and automatic analysing the process defects by inputting the conditions of defects into computer. Thereby, it is possible to increase throughput and yield by automatic classifying the process defects.
申请公布号 KR0132024(B1) 申请公布日期 1998.04.14
申请号 KR19930028881 申请日期 1993.12.21
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO.,LTD 发明人 BAE, SANG-MAN
分类号 H01L21/66;(IPC1-7):H01L21/66 主分类号 H01L21/66
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