发明名称 |
Semiconductor wafer smoothing method |
摘要 |
The method involves forming a pattern of grooves (10) and posts (14) on a semiconductor substrate (15). The grooves are filled with appropriate material (12), and the posts, possibly with caps (17), are covered. Then a photoresistant layer (19) is deposited over the filling material, is patterned, and removed from some regions over the posts. The exposed photoresist layer and the filling material are smoothed by simultaneous isotropic etching. Pref. the filling material is applied to all exposed horizontal surfaces with the same thickness, e.g. equal to the depth of the grooves.
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申请公布号 |
DE19736145(A1) |
申请公布日期 |
1998.04.02 |
申请号 |
DE19971036145 |
申请日期 |
1997.08.20 |
申请人 |
NATIONAL SEMICONDUCTER CORP., SANTA CLARA, CALIF., US |
发明人 |
SNYDER, JOHN, LOS ALTOS, CALIF., US |
分类号 |
H01L21/762;(IPC1-7):H01L21/762;H01L21/768 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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