首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
Verfahren zur Herstellung einer Mehrfarben-Anzeigevorrichtung
摘要
申请公布号
DE69215449(T2)
申请公布日期
1997.04.24
申请号
DE19926015449T
申请日期
1992.08.06
申请人
NIPPON PAINT CO., LTD., OSAKA, JP
发明人
MATSUMURA, AKIRA, HIRAKATA-SHI, OSAKA-FU, JP;OHATA, MASASHI, NEYAGAWA-SHI, OSAKA-FU, JP
分类号
G02B5/20;G02F1/1335;G03F7/00;G03F7/20;(IPC1-7):G02F1/133
主分类号
G02B5/20
代理机构
代理人
主权项
地址
您可能感兴趣的专利
IMAGE FORMING APPARATUS, IMAGE FORMING METHOD, AND IMAGE FORMING SYSTEM
IMAGE FORMING UNIT, DEVELOPER STORAGE BODY, AND IMAGE FORMING APPARATUS
RECEPTION DEVICE, RECEPTION METHOD, AND PROGRAM
PROJECTOR
DISPLAY DEVICE AND METHOD OF USING THE SAME
ACCESS CONTROL SYSTEM AND ACCESS CONTROL METHOD
FIRST AND SECOND LIQUIDS FOR TWO-LIQUID MIXING SYSTEM AND METHOD FOR MANUFACTURING PRINTED WIRING BOARD
IMAGE FORMING APPARATUS, CONTROL METHOD OF FIXING PART, AND CONTROL PROGRAM FOR FIXING PART
HEAT TREATMENT DEVICE
EPITAXIAL WAFER FOR HETEROJUNCTION BIPOLAR TRANSISTOR AND HETEROJUNCTION BIPOLAR TRANSISTOR
FRAME ERROR CONCEALMENT METHOD AND APPARATUS, AND AUDIO DECODING METHOD AND APPARATUS
MONITORING SYSTEM, MONITORING DEVICE AND MONITORING METHOD
ELECTROMAGNETIC WAVE POWER GENERATOR
DETECTION APPARATUS, DETECTION METHOD, AND PROGRAM
PROTECTIVE SUBSTRATE FOR DISPLAY DEVICE
INSPECTION APPARATUS OF SEMICONDUCTOR WAFER AND AUTOMATIC INSPECTION METHOD OF SEMICONDUCTOR WAFER
FUTURE TYPE PEDIGREE CONSTRUCTION SYSTEM
MULTIPOINT CONFERENCE DEVICE, MULTIPOINT CONFERENCE CONTROL PROGRAM, AND MULTIPOINT CONFERENCE CONTROL METHOD
リン酸塩輸送阻害のための化合物及び方法
圧縮性流体の圧力差分子分光学のためのシステムおよび方法