发明名称 PROCESS AND DEVICE FOR MEASURING THE CONCENTRATION OF A DETECTOR GAS IN A MEASURING GAS CONTAINING AN INTERFERING GAS
摘要 <p>PCT No. PCT/DE93/00333 Sec. 371 Date Oct. 21, 1994 Sec. 102(e) Date Oct. 21, 1994 PCT Filed Apr. 13, 1993 PCT Pub. No. WO93/21515 PCT Pub. Date Oct. 28, 1993A concentration of a detector gas in a measuring gas containing an interfering gas is measured. A zero gas that is free of the detector gas and/or a test gas having a known concentration of the detector gas are supplied to an analyzer such as a non-dispersive infrared (NDIR) gas analyzer. Interfering gas is added to the measuring gas, the zero gas, and in some instances, to the test gas to an extent which allows the interfering gas to have a same concentration in each case.</p>
申请公布号 EP0637376(B1) 申请公布日期 1997.03.05
申请号 EP19930907798 申请日期 1993.04.13
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 KIMMIG, LUDWIG
分类号 G01N21/3504;G01N33/00;(IPC1-7):G01N21/35 主分类号 G01N21/3504
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