Apparatus for inspecting electric components for inverter circuit.

摘要

The method involves turning on only a transistor to be inspected which is connected in an inverter circuit. A predetermined collector current is supplied to the transistor from a power supply until a junction temperature of the transistor reaches a predetermined temperature. The transistor is determined as being acceptable if the difference between a collector-to-emitter voltage of the transistor when the predetermined collector current is supplied from the power supply to the transistor and a collector-to-emitter voltage of the transistor when the junction temperature of the transistor reaches the predetermined temperature falls within a preset range. Independent claims are included for an appts. for inspecting transistors in an inverter circuit and for a method for inspecting an electrolytic capacitor in an inverter circuit.