发明名称 Window processing for silicon components.
摘要 <p>A method for forming a contact window in an oxide layer formed on a semiconductor substrate is disclosed. The method comprises the steps of: implanting a dopant into the oxide layer, followed by isotropic and anisotropic etching of a window area of the oxide. The steps form. the contact window in the oxide layer at the window area permitting a sub-micron linewidth contact layer to be formed within the contact window. The invention avoids the formation of re-entrant window wall edges in the oxide layer.</p>
申请公布号 EP0657926(A2) 申请公布日期 1995.06.14
申请号 EP19940308856 申请日期 1994.11.30
申请人 AT&T CORP. 发明人 MAURY, ALVARO
分类号 H01L21/768;(IPC1-7):H01L21/768 主分类号 H01L21/768
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