发明名称 |
Process and device for etching thin layers, preferably Indium-Tin-Oxide layers. |
摘要 |
In the case of a device for etching thin films (layers), preferably indium-tin-oxide films on glass substrates in a vacuum chamber (2), with a plasma source (12) arranged above the latter, a substrate holder (5) located opposite this plasma source and having a high-frequency source (8) connected to the substrate holder (5), the etching gas Cl2 or Cl2 and H2 or CH4 can be let into the vacuum chamber (2), the high-frequency bias supply (8, 9) of the substrate holder (5) being adjustable independently of the etching particle density, and the plasma source (12) being supplied by a separate high-frequency source (16) which has its own matching network (17). <IMAGE> |
申请公布号 |
EP0652585(A1) |
申请公布日期 |
1995.05.10 |
申请号 |
EP19940105261 |
申请日期 |
1994.04.05 |
申请人 |
LEYBOLD AKTIENGESELLSCHAFT |
发明人 |
KRETSCHMER, KARL-HEINZ, DR. DR.-ING.;LORENZ, GERHARD;GEGENWART, RAINER, DR. DIPL.-PHYS. |
分类号 |
H01J27/16;H01J37/305;H01J37/32;H01L21/302;H01L21/3065;H01L31/18;H05H1/46 |
主分类号 |
H01J27/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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