发明名称 |
Semiconductor wafer cleaning and rinsing techniques. |
摘要 |
Method comprises: removing the photoresist with a stripper: rinsing by immersing in water; pumping CO2 into the rinsing vessel; and at the same time pumping in water to cause the water to overflow, the overflow rate being at least 50 vol.% per min.. Pref. the wafer is in the rinsing vessel for 5-20, about 10 mins.. The vessel vol. is 4 galls and the water flow rate is 2.5 galls/min.. A batch of wafers is rinsed in the same vessel. |
申请公布号 |
EP0617459(A3) |
申请公布日期 |
1995.01.18 |
申请号 |
EP19940301666 |
申请日期 |
1994.03.09 |
申请人 |
AT & T CORP |
发明人 |
CHUNG BRYAN CHAEYOO;DIBELLO GERALD NICHOLAS;PEARCE CHARLES WALTER;YANDERS KEVIN PAUL |
分类号 |
H01L21/304;G03F7/42;H01L21/02;H01L21/306;H01L21/3213 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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