发明名称 Semiconductor wafer cleaning and rinsing techniques.
摘要 Method comprises: removing the photoresist with a stripper: rinsing by immersing in water; pumping CO2 into the rinsing vessel; and at the same time pumping in water to cause the water to overflow, the overflow rate being at least 50 vol.% per min.. Pref. the wafer is in the rinsing vessel for 5-20, about 10 mins.. The vessel vol. is 4 galls and the water flow rate is 2.5 galls/min.. A batch of wafers is rinsed in the same vessel.
申请公布号 EP0617459(A3) 申请公布日期 1995.01.18
申请号 EP19940301666 申请日期 1994.03.09
申请人 AT & T CORP 发明人 CHUNG BRYAN CHAEYOO;DIBELLO GERALD NICHOLAS;PEARCE CHARLES WALTER;YANDERS KEVIN PAUL
分类号 H01L21/304;G03F7/42;H01L21/02;H01L21/306;H01L21/3213 主分类号 H01L21/304
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