发明名称 Apparatus for and method of measuring beam spot luminescence distribution
摘要 The invention relates to a method and a device for measuring a luminescence distribution within a beam spot of an electron beam irradiated on a tube surface of a color cathode ray tube. The measuring region is fixed within the specific fluorescent substance of the tube surface. The irradiated locations of the electron beam are variably changed, satisfying the condition that the beam spot contains the measurement region. The luminescent brightness of the measurement region is measured at each irradiated location of the electron beam. Furthermore, the luminescence distribution of the beam spot is determined based on each luminescent brightness.
申请公布号 US5334911(A) 申请公布日期 1994.08.02
申请号 US19920857316 申请日期 1992.03.25
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 EMMOTO, KAZUO
分类号 H01J9/42;H04N17/04;(IPC1-7):H01J31/26;H04N17/02 主分类号 H01J9/42
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