发明名称 Unitary transform methods of identifying defects in imaging devices
摘要 An automated system for determining artifacts in images indicating defects in an imaging device being tested employs a constant radiation source which supplies radiation of spatially uniform intensity to the imaging device to be tested. The imaging device then creates a flood image A(0). A region of interest (ROI) mask unit for all pixel values of flood image A(0) sets values to zero outside of the imaging devices field of view to produce a flood image A(1). An image normalization unit normalizes flood image A(1) to have an average value of zero producing a normalized flood image A. A unitary transform unit performs a unitary transformation of normalized flood image A to produce an transform field which is then masked to select portions of the transform field. The squared magnitudes of the transform values of the selected regions are summed and the resulting sum is normalized for mask shape and flood image intensity to determine and quantify the presence of specific artifacts. The normalized summed value may be compared to a predetermined threshold to determine if the artifacts have a magnitude above an acceptable level. Based upon the results of the comparison, a corrective action may be taken such as removing the imaging device from a manufacturing line or adjusting the imaging device and retesting it.
申请公布号 US5325198(A) 申请公布日期 1994.06.28
申请号 US19930040959 申请日期 1993.03.31
申请人 GENERAL ELECTRIC COMPANY 发明人 HARTLEY, RICHARD I.;ABDEL-MALEK, AIMAN A.;ISHAQUE, A. NADEEM
分类号 H04N17/00;(IPC1-7):H04N17/00 主分类号 H04N17/00
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