DEFECT INSPECTION DEVICE,申请号JP19920162995-传众专利搜索

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发明名称	DEFECT INSPECTION DEVICE
摘要
申请公布号	JPH063285(A)	申请公布日期	1994.01.11
申请号	JP19920162995	申请日期	1992.06.22
申请人	OMRON CORP	发明人	OGINO KENJI
分类号	G01N21/88;G01N21/89;G01N21/892;(IPC1-7):G01N21/89	主分类号	G01N21/88
代理机构		代理人
主权项
地址

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