发明名称 Method for etching a silicon wafer and method for performing differentiation between the obverse and the reverse of a silicon wafer using the same method
摘要 The invention is improvement of a silicon wafer etching method of storing an acid etching solution and an alkali etching solution respectively in plural etching tanks, and immersing a silicon wafer having a work-degenerated layer, which has experienced a lapping process and then a cleaning process, in the acid etching solution and the alkali etching solution in order. Its characteristic configuration is in that an alkali etching process is performed after an acid etching process, the etching removal depth for acid etching is made to be equal to or larger than the etching removal depth for alkali etching, and the etching rate of acid etching is made to be 0.0075 mum/sec to 0.05 mum/sec in total of the obverse and the reverse of the silicon wafer.
申请公布号 US2006194441(A1) 申请公布日期 2006.08.31
申请号 US20050067117 申请日期 2005.02.25
申请人 KOYATA SAKAE;TAKAISHI KAZUSHIGE;NORIMOTO MASASHI 发明人 KOYATA SAKAE;TAKAISHI KAZUSHIGE;NORIMOTO MASASHI
分类号 H01L21/302;B44C1/22;C23F1/00 主分类号 H01L21/302
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