发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To make the highly precise dry-etching processing feasible for enhancing the reliability upon the devices such as wiring, capacitor, etc. CONSTITUTION:After coating a carbon film 14 on the surface of a base substance to be processed having a film 13 such as AlSiCu, etc., on the surface of a Si substrate 11 a resist 15 is formed after specific pattern on the carbon film 14 which is further patterned using the resist 15 as a mask and then the film 13 is selectively subjected to dry-etching using high density plasma as well as the carbon film 14 as a mask.
申请公布号 JPH0590224(A) 申请公布日期 1993.04.09
申请号 JP19920003372 申请日期 1992.01.10
申请人 TOSHIBA CORP 发明人 HORI MASARU;YANO HIROYUKI;HORIOKA KEIJI;OKANO HARUO
分类号 C23F4/00;G03F7/09;H01L21/302;H01L21/3065;H01L21/308;H01L21/311;H01L21/314;H01L21/3213 主分类号 C23F4/00
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