发明名称 Method of making high density semiconductor structure
摘要 A method of forming a high density semiconductor structure including one or more buried metal layers. One or more metal layers may be formed on a first semiconductor substrate, with the metal layer or layers being insulated from one another and from the substrate. One or more metal layers may be formed on the surface of a second substrate which may or may not be a semiconductor substrate. The topmost metal layers, either or both of which may have an insulating layer thereon, are placed in contact and heated in an oxidizing ambient atmosphere to form a bond therebetween. One or more vias connect the buried metal layers to the active devices in the substrates. The buried metal layers may form buried power and ground planes and buried metallization patterns for device interconnection.
申请公布号 US5168078(A) 申请公布日期 1992.12.01
申请号 US19900631671 申请日期 1990.12.21
申请人 MCNC;NORTHERN TELECOM LIMITED 发明人 REISMAN, ARNOLD;TURLIK, IWONA
分类号 H01L23/48;H01L23/535 主分类号 H01L23/48
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