| 摘要 |
PURPOSE:To facilitate debugging by using test data in common to logic simulation and a test so as to shorten working time, and also enabling the result of the test to be analyzed under the same environment as the logic simulation. CONSTITUTION:A simulation portion 3 performs logic simulation using input- output waveform 2 input from a waveform input display portion 1 and the result of the simulation including the input-output waveform 2 is stored in a database 6. Data stored in the database 6 are converted into test data and a testing portion 7 apples the test data to a physical circuit and operates the circuit so that defective ICs are sorted. The result of the test is stored in the database 6 and displayed under the same operational environment as the simulation and then an operator analyzes the result of the test in interactive fashion. |
