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发明名称
Semiconductor lead planarity checker
摘要
The planarity of semiconductor device pins is measured simultaneously by multiple pneumatic comparator circuits by detecting pressure changes proportional to pin position.
申请公布号
US5163232(A)
申请公布日期
1992.11.17
申请号
US19900481000
申请日期
1990.02.16
申请人
TEXAS INSTRUMENTS INCORPORATED
发明人
GONZALES, JR., DAVID;CHIU, ANTHONY M.
分类号
H05K13/08
主分类号
H05K13/08
代理机构
代理人
主权项
地址
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