发明名称 ANALYSIS OF SAMPLE BY X-RAY DIFFRACTION
摘要 PURPOSE:To shorten a detection time and to enhance a hit rate by extracting a necessary number (n) of the strong lines within a measuring angle range from the (N) strong line reverse file of a standard sample to prepare a (n) strong line reverse file. CONSTITUTION:At first, a 10-strong line reverse file prepared by pulling out (N) strong lines in a standard card is read. Next, it is judged whether there is the strongest line in the reverse file within a measuring angle range and, when there is no strongest line, the relative strength of each peak is calculated. Next, three strong lines within the measuring angle range are extracted from the 10-strong line reverse file to prepare a three-strong line reverse file. Thereafter, the measurement of a diffraction pattern is performed with respect to a sample to be analyzed. The strongest line of the measured diffraction pattern is set to 100 to calculate the relative strength of each peak. Next, the angle of diffraction of the converted diffraction pattern, diffraction line relative strength and the three-strong line reverse file are collated and the coincidence one is detected. The standard sample data left as the result of detection and the diffraction data of the sample to be measured are collated to judge an acceptance range and the substance within the acceptance range is displayed as an identified substance.
申请公布号 JPH03226663(A) 申请公布日期 1991.10.07
申请号 JP19900022781 申请日期 1990.01.31
申请人 SHIMADZU CORP 发明人 YASUDA ZENICHI;SHINDO TAKUYA
分类号 G01N23/20 主分类号 G01N23/20
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