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发明名称
CIRCUIT FOR TESTING TIMER IC
摘要
申请公布号
KR1019910007694(B1)
申请公布日期
1991.09.30
申请号
KR1019880014800
申请日期
1988.11.11
申请人
发明人
分类号
主分类号
代理机构
代理人
主权项
地址
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