发明名称 Multi-layered antireflection film preventing reflection at two wavelength regions
摘要 A multi-layered antireflection film preventing reflection at two wavelength regions has a substrate of a refractive index nsub and a 5-layered structured formed on the substrate and composed of a first layer group including three layers of n1( lambda 1/4)-n2( lambda 2/2)-n3( lambda 1/4) and a second layer group including two layers of n4( lambda 1/4)-n5( lambda 1/4). The factors are determined such that the following conditions are met: 1<n1</=nsub, n2>/=nsub 1<n3</=nsub and nsub (n52/n42) &persp& 1 The layers of the first layer group are made of materials selected from dielectric materials exhibiting compression stresses, while the layers of the second group layer are made of materials selected from dielectric materials exhibiting tensile stresses.
申请公布号 US4997241(A) 申请公布日期 1991.03.05
申请号 US19890431186 申请日期 1989.11.03
申请人 KABUSHIKI KAISHA TOPCON 发明人 MURATOMI, KEIJI
分类号 G02B1/11;G02B5/28 主分类号 G02B1/11
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