IC device including test circuit.

摘要

In an IC device (10), an IC body (20) having a predetermined function and high-frequency test easy circuits (30, 40) for testing high-frequency characteristics of the IC body (20) are formed on a single chip. The test easy circuits include an L-H frequency conversion circuit (30) arranged on the input side of the IC body (20) and an H-L frequency conversion circuit (40) arranged on the input side. The test easy circuits can switch a connecting state between the conversion circuits (30, 40) and the IC body (20) in response to an external control signal. The test easy circuits can be disconnected from the IC body (20) after a test is completed.