| 摘要 |
PURPOSE:To enable the functional test of a whole LSI to be easily executed by respectively and serially connecting a first memory circuit part and a second memory circuit part or a third memory circuit part and a fourth memory circuit part, connecting the second memory part to the third memory circuit part to share a first capacitor. CONSTITUTION:Switches 21 and 35 which open and close, capacitors 29 and 39 which store an electric signal by accumulating charge and a shift register which is constituted by connecting the memory circuits 1 and 3 consisting of inverters 33 and 37 which output the input shares the capacitor 39. They are connected and controlled by a clock signal. Thus, the capacitor can be controlled from plural paths and the input/output of the electric signal accumulated in the capacitor can be facilitated. As the result of that, the functional test of the whole LSI can be easily executed. |
