| 摘要 |
PURPOSE:To improve the probability of readable state by means of re-read and the further retrial read when a read error takes place by providing plural kinds of sample timings so as to change the sample timing for a 2nd read and a 3rd read trial. CONSTITUTION:The titled circuit is provided with a demodulation circuit (F2F data demodulation section 3) reading a level of a magnetic read signal at a prescribed sample timing and demodulating it into a data signal, a sample timing setting section 8 preset with plural kinds of sample timings, and a sample timing switch section 7 selecting the sample timing designated by the control signal in response to the control signal input. When the read error of the demodulated data signal is detected, a control signal commanding to select the different sample timing is given to the sample timing switching section 7 and the 2nd read is applied in the different sample timing from the preceding read processing. When error takes place consecutively, the other sample timing is switched to try the 3rd read.
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