发明名称 |
Semiconductor integrated circuit device having rest function |
摘要 |
A semiconductor integrated circuit device includes a plurality of latch circuits which are provided between adjacent circuit blocks. Each latch circuit functions to transfer output data from a preceding circuit block directly to a subsequent circuit block during a normal operation of the circuit device, to hold the output data until a scanning of associated scan register and supply them to the subsequent circuit block in a scan mode of a test operation and to hole the output data while outputting them in synchronism with an external clock in a test mode of the test operation.
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申请公布号 |
US4780666(A) |
申请公布日期 |
1988.10.25 |
申请号 |
US19870081256 |
申请日期 |
1987.08.03 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
SAKASHITA, KAZUHIRO;KISHIDA, SATORU;HANIBUCHI, TOSHIAKI;TOMIOKA, ICHIRO;ARAKAWA, TAKAHIKO |
分类号 |
G01R31/28;G01R31/3185;G06F11/22;(IPC1-7):G01R15/12 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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