| 摘要 |
A pattern matching apparatus wherein an input pattern is compared against a reference pattern by a distance or similarity measure (dij) between data at respective time points (i, j) of the two patterns. An integration variable (gij) of the distance measure is developed along a time path between the time axes of the two patterns to provide a measure of pattern matching. According to the invention, the path may deviate from 45 DEG , i.e. the input pattern becomes locally time-compressed or time-expanded, only toward the time axis of the longer pattern. Therefore, local time compression or expansion is allowed only if the total input pattern length requires time compression or expansion, respectively, to match the total length of the reference pattern.
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