发明名称 METHOD OF FABRICATING A SEMICONDUCTOR DEVICE HAVING A SILICON-ON-SAPPHIRE STRUCTURE
摘要 <p>This invention relates to improvements in the SOS technology including the so-called laser annealing processing. According to this invention, a semiconductor layer of an SOS structure consists of the three layers of an interface layer made up of twins, a seed crystalline layer and a re-grown layer far thicker than the preceding two layers when viewed from the side of an insulating substrate. The re-grown layer is formed in such a way that a semiconductor layer deposited on the insulating substrate is irradiated with an electromagnetic wave, for example, pulsed ruby laser beam, which is absorbed substantially uniformly by a portion except the interface layer and the seed crystalline layer. According to this invention, the quality of the re-grown layer is improved, and the mobility of carriers is enhanced. As a result, the operating speed of a semiconductor device employing the SOS structure is raised, and the leakage current is reduced.</p>
申请公布号 EP0042175(B1) 申请公布日期 1987.09.09
申请号 EP19810104653 申请日期 1981.06.16
申请人 HITACHI, LTD. 发明人 KOBAYASHI, YUTAKA;SUZUKI, TAKAYA
分类号 H01L29/78;H01L21/20;H01L21/205;H01L21/26;H01L21/268;H01L21/428;H01L21/86;H01L27/12;H01L29/786;(IPC1-7):H01L21/268 主分类号 H01L29/78
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