发明名称 MANUFACTURE OF LAMINATED SEMICONDUCTOR DEVICE
摘要 PURPOSE:To prevent the generation of bent, breakage and so on of a semiconductor element in the drying process for a surface protective agent by a method wherein the hardness of the element is set in such a way as to show a specific value or more after the surface protective agent is dried. CONSTITUTION:The hardness of a surface protective layer 4 of a columnar laminated material 10 consisting of semiconductor pieces 1 laminated through soft solders is set at 1H or more at pencil hardness when a surface protective agent is cooled at 180 deg.C or less after being dried. Thereby, even though solder layers 2 are softened at the time of a drying process of at least 180 deg.C, it is eliminated that the laminated material 10 is broken or curved and the manufacturing yield of a laminated semiconductor device like a high-pressure diode can be improved.
申请公布号 JPS62162350(A) 申请公布日期 1987.07.18
申请号 JP19860001579 申请日期 1986.01.08
申请人 FUJI ELECTRIC CO LTD 发明人 HAYAMA TADAO
分类号 H01L21/52;H01L21/58;H01L25/07 主分类号 H01L21/52
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