| 摘要 |
PURPOSE:To form an EPROM testing device capable of measuring the write time of an EPROM and classifying a quality grade based on the write time by deciding the completion of a write on each address by performing alternately a data write and a data read on each address of the EPROM, and comparing the write data with the read data. CONSTITUTION:Since the write time can be displayed on each EPROM that is equipped with a means 16 which performs the data write and the data read on each address of the EPROM alternately, means 30(1)-30(N) which decide the completion of the data write on each address of the EPROM by comparing the read data with the write data on each address of the EPROM, and means 34(1)-34(N) which measure the write time until the data write of all addresses is completed, a user side can efficiently perform the write of a requested data, etc., in the minimum time by fitting the write time of each EPROM.
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