发明名称 TEST SYSTEM OF DATA PROCESSOR
摘要 PURPOSE:To produce easily a test program containing the expected value data by executing the test program on a simulator and using the result of said execution as the expected data to test a data processor to be tested. CONSTITUTION:A test program 1 is stored to a main memory part 21 of a simulator 2, and an instruction analysis part 221 reads an instruction word out of the part 21 through an instruction processing part 22. Then an instruction executing part corresponding to an instruction code in the instruction word is started out of an instruction group executing part 222. The result of a test carried out according to a test procedure 10 is stored to the part 21. Then a part 221 decodes an expected value production instruction and starts an expected value production instruction executing part 224. This start information is informed to an input/ output control part 20, and the test result (expected value data) is read out of the part 21 and stored to an external memory 3. The produced expected value data and the program 1 are used to give a test to a data processor 4 to be tested.
申请公布号 JPS6123248(A) 申请公布日期 1986.01.31
申请号 JP19840143592 申请日期 1984.07.11
申请人 NIPPON DENKI KK 发明人 NISHIOKA HIROSHI
分类号 G06F11/22;G06F11/26 主分类号 G06F11/22
代理机构 代理人
主权项
地址