发明名称 CHARACTERISTIC MEASURING DEVICE OF CONDUCTIVE FILM
摘要 PURPOSE:To measure characteristics of a conductive film by non-contact, at a low cost and with high accuracy by positioning a conductive film between a pair of eddy current detectors, and measuring an eddy current of the conductive film. CONSTITUTION:An eddy current of a conductive film 2 moved at a prescribed speed through a transfer roll 3 is detected by eddy current detectors 1a, 1b which are opposed by placing the film 2 inbetween. Its detecting signal is brought to operation processing by an average arithmetic unit 5 through an amplifier 4, and an obtained electric resistance value is indicated on an indicator 6. In this way, characteristics of the conductive film 2 are measured by non-contact, at a low cost and with high accuracy.
申请公布号 JPS60249067(A) 申请公布日期 1985.12.09
申请号 JP19840103694 申请日期 1984.05.24
申请人 TEIJIN KK;TEIJIN ENGINEERING KK 发明人 SUGIMOTO TOMIO;SATOU YOSHINORI;NAKAJIMA TOSHIKAZU
分类号 G01R27/02;G01B7/00;G01B7/06 主分类号 G01R27/02
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