| 摘要 |
<p>57 tomographic testing apparatus employs two data collection modes. One of these modes is a reference data collection mode in which almost all of the prescribed image data (X1, X2, X4, X5, X7, X8 and X10) of a reference sample is obtained. The reference sample has no defect. The other of these modes is a measurement mode in which a predetermined small number of image data (Y3, Y6 and Y9) of an inspection sample is obtained. The inspection sample to be tested may have defective portions. The tomographic image of the inspection sample is obtained from the combination (X1, X2, Y3, X4, X5, Y6, X7, X8, Y9 and X10) of the inspection sample image data (Y3, Y6 and Y9) and the reference sample image data (X1, X2, X4, X5, X7, X8 and X10) from which specific data (X3, X6 and X9) corresponding to the inspection sample image data (Y3, Y6 and Y9) is deleted.</p> |
