发明名称 Apparatus for and method of controlling sputter coating
摘要 The magnetic field of a magnetron sputter coating apparatus is controlled in response to measurements of plasma parameters to control deposition parameters, such as sputter deposition rate and material deposition thickness profile. From time to time the apparatus is standardized to change preset values for parameters of the plasma to manage the deposition parameters.
申请公布号 US4500408(A) 申请公布日期 1985.02.19
申请号 US19830564776 申请日期 1983.12.27
申请人 VARIAN ASSOCIATES, INC. 发明人 BOYS, DONALD R.;SMITH, ROBERT M.
分类号 C23C14/54;H01J37/34;(IPC1-7):C23C15/00 主分类号 C23C14/54
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