| 摘要 |
<p>The invention relates to apparatus for analyzing electrical circuit boards. Individual elements which have failed can be identified without disconnecting them from the circuit and testing may be done by unskilled operators by contacting a probe to a lead on an element. The probe has at least two contact elements close enough to each other to simultaneously contact a lead of a mounted integrated circuit, but spaced apart from each other sufficiently to permit measurement of electrical activity in the lead segment between the tips. Circuitry is connected to the probe for measuring the voltage drop between the two tips resulting from the flow of test current through the resistance of the lead segment, which current flow is indicative of the condition of the element.</p> |
