| 摘要 |
PURPOSE:To obtain an IC memory testing device of simple constitution which has a less unnecessary part and good efficiency, by switching and using a combined counter/register circuit. CONSTITUTION:When the input part 12 of an IC memory testing device is operated according to the kind of an IC memory 2 to be tested, a multiplexer selection signal is generated by a control part 11a according to the program in a storage part 13a. Then, a combined corresponding counter/register circuit 17 is selected and switched by the program; the address generated by a counter and data buffered in a register are outputted and a test of the memory 2 is taken without using two systems, i.e. the counter and the register. Therefore, the efficient IC memory testing device of the simple constitution which have such a less unnecessary part that one system halts is obtained. |
