发明名称 |
METHOD OF ANALYZING GADOLINIUM |
摘要 |
A method and apparatus for analyzing combined secondary and primary materials by directing primary radiation onto said material whereby secondary radiation is generated. A detector senses the secondary radiation as a transport carries the materials into the vicinity of primary radiation and produces signals to be resolved into secondary and primary material source components, establishing a secondary to primary material ratio and indicating the composition of the material. |
申请公布号 |
JPS5866042(A) |
申请公布日期 |
1983.04.20 |
申请号 |
JP19820143502 |
申请日期 |
1982.08.20 |
申请人 |
GENERAL ELECTRIC CO |
发明人 |
ARUFURETSUDO JIYUURISU TSUAITO;ROBAATO OOEN KANADA |
分类号 |
G01N23/22;G01N23/223;G21C17/06 |
主分类号 |
G01N23/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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