发明名称 CONDUCTIVE FOREIGN MATTER INSPECTION DEVICE FOR SEPARATOR
摘要 PROBLEM TO BE SOLVED: To prevent conductive foreign matter included in a separator from being analyzed with difficulty due to damage of the foreign matter after inspection, in a conductive foreign matter inspection device for the separator.SOLUTION: A conductive foreign matter inspection device for a separator includes: two electrodes 1, 2 between which a separator 3 is sandwiched; a DC power source 7 connected to the electrodes 1, 2; current detection means 4 provided between the DC power source 7 and the electrodes 1, 2; a capacitor 5 provided between the DC power source 7 and the current detection means 4; and current control means 6 provided between the DC power source 7 and the capacitor 5.SELECTED DRAWING: Figure 1
申请公布号 JP2016133325(A) 申请公布日期 2016.07.25
申请号 JP20150006425 申请日期 2015.01.16
申请人 MITSUBISHI PAPER MILLS LTD 发明人 KATO MAKOTO;KASAI TAKAKO
分类号 G01N27/20;G01N27/92;H01G13/00 主分类号 G01N27/20
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