| 摘要 |
PURPOSE:To exchange a deteriorated IC easily by leaving the deteriorated beam lead IC, cutting off one part of a conductor pattern formed on an insulating substrate without cutting the beam lead and loading a novel beam lead IC. CONSTITUTION:One part of each conductor pattern 7 to which each beam lead 3 of the deteriorated beam load IC1 is connected is cut off in width slightly winder than the width w of the IC1 proper. The novel beam lead IC12 of the same kind and number as the beam lead IC1 is loaded on the cut-off position. In this case, each beam lead 13 connected to an anode electrode of the IC12 is connected being opposed to the conductor patterns 7, but beam leads 14 connected to a common cathode are connected in shapes that igore correspondence. A conductor layer 15 covering the whole deteriorated beam lead IC1 is formed. Accordingly, the deteriorated IC can easily be exchanged without causing electrical short circuit. |
