| 摘要 |
PURPOSE:To realize the area measurement for the pattern via a small-capacity memory device by attaching the labels to the runlength data obtained through the prescribed method and in the detection sequence of the partial patterns. CONSTITUTION:The subject is scanned by quantization means 1, and 1 and 0 are given to the areas belonging and not belonging to the pattern part respectively. Then the runlength data is formed via partial connecting relation process means 5 based on a pair of data formed by position A which changes to 1 from 0 on a scanning row and position B changing to 0 from 1 after detection of A. At the same time, the labels are given to the data in the detection sequence of the partial patterns. Thus the connection relation is detected and memorized for the partial patterns. Then the counting is given every same labels via partial pattern area process means 7, and the partial pattern connection plus the area of the partial patterns connected with the partial pattern area are measured via pattern area process means 8. In such way, the pattern area can be measured by a small-capacity memory. |
