发明名称 MASTER TEST SYSTEM
摘要 PURPOSE:To make a test effectively with the increase of controllers in number eliminated, by providing a switching unit between the group center and tested station of the star-type network at a great distance in terms of maintenance and by making it possible to test more than four tested stations through one circuit and to transfer the trouble.
申请公布号 JPS53123014(A) 申请公布日期 1978.10.27
申请号 JP19770037726 申请日期 1977.04.01
申请人 NIPPON ELECTRIC CO 发明人 SAKATA KIYOO
分类号 H04M3/26;H04M7/00;H04Q1/26 主分类号 H04M3/26
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