发明名称 FABRICATING METHOD OF SEMICONDUCTOR DEVICE
摘要 The method for manufacturing a semiconductor device having a silicide film formed on a silicon layer, comprises the step of: forming a buffer film on the silicon; forming a silicon and a conduction layer including a high melting point metal on the buffer film; and carrying out heat treatment of the resulting structure. The silicide film of regular thickness is uniformly formed without generation of lumps on an active region of element or on a gate electrode.
申请公布号 KR960002065(B1) 申请公布日期 1996.02.10
申请号 KR19920017556 申请日期 1992.09.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SIN, HUN - JONG
分类号 H01L21/283;H01L29/78;(IPC1-7):H01L21/283 主分类号 H01L21/283
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