发明名称 |
FABRICATING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
The method for manufacturing a semiconductor device having a silicide film formed on a silicon layer, comprises the step of: forming a buffer film on the silicon; forming a silicon and a conduction layer including a high melting point metal on the buffer film; and carrying out heat treatment of the resulting structure. The silicide film of regular thickness is uniformly formed without generation of lumps on an active region of element or on a gate electrode.
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申请公布号 |
KR960002065(B1) |
申请公布日期 |
1996.02.10 |
申请号 |
KR19920017556 |
申请日期 |
1992.09.25 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
SIN, HUN - JONG |
分类号 |
H01L21/283;H01L29/78;(IPC1-7):H01L21/283 |
主分类号 |
H01L21/283 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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