发明名称 |
METHOD FOR MANUFACTURING CONDUCTIVE WIRES IN SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE: A conductive wire manufacturing method is provided to be capable of prohibiting deformation of shape such as contraction and bending of the conductive wires, by forming a capping layer having an anti-stress property at the bottom of the conductive wires. CONSTITUTION: An insulating film(64) having a high fluidity is formed on a semiconductor substrate(60) so that the entire surfaces of the structure on the semiconductor substrate can be flattened. A capping layer(65) made of one of an oxide film, a nitride film or an oxynitride film that are not easily deformed by annealing process is formed in thickness of about 500 angstrom on the insulating film(64). A conductive film is formed on the capping layer(65) and is then patterned, thus forming a conductive wire(68). Then, the conductive wire is treated by annealing process so that it can be stabilized.
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申请公布号 |
KR20010008514(A) |
申请公布日期 |
2001.02.05 |
申请号 |
KR19990026390 |
申请日期 |
1999.07.01 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHAE, SU JIN;LEE, SE MIN;LEE, U YEONG;SHIN, SEUNG U;SON, YONG SEON |
分类号 |
H01L21/3205;(IPC1-7):H01L21/320 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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