发明名称 METHOD FOR MANUFACTURING CONDUCTIVE WIRES IN SEMICONDUCTOR DEVICES
摘要 PURPOSE: A conductive wire manufacturing method is provided to be capable of prohibiting deformation of shape such as contraction and bending of the conductive wires, by forming a capping layer having an anti-stress property at the bottom of the conductive wires. CONSTITUTION: An insulating film(64) having a high fluidity is formed on a semiconductor substrate(60) so that the entire surfaces of the structure on the semiconductor substrate can be flattened. A capping layer(65) made of one of an oxide film, a nitride film or an oxynitride film that are not easily deformed by annealing process is formed in thickness of about 500 angstrom on the insulating film(64). A conductive film is formed on the capping layer(65) and is then patterned, thus forming a conductive wire(68). Then, the conductive wire is treated by annealing process so that it can be stabilized.
申请公布号 KR20010008514(A) 申请公布日期 2001.02.05
申请号 KR19990026390 申请日期 1999.07.01
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHAE, SU JIN;LEE, SE MIN;LEE, U YEONG;SHIN, SEUNG U;SON, YONG SEON
分类号 H01L21/3205;(IPC1-7):H01L21/320 主分类号 H01L21/3205
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