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发明名称	IC TEST HEAD
摘要
申请公布号	JPH08327693(A)	申请公布日期	1996.12.13
申请号	JP19950133687	申请日期	1995.05.31
申请人	NEC CORP	发明人	MAEDA AKIRA
分类号	G01R31/26;G01R31/30;(IPC1-7):G01R31/26	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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