发明名称 Complementary metal-oxide-semiconductor image sensor and method for fabricating the same
摘要 A complementary metal-oxide-semiconductor (CMOS) image sensor and a method for fabricating the same are provided. The CMOS image sensor includes: a pixel region provided with a plurality of unit pixels, each including a buried photodiode and a floating diffusion region; and a logic region provided with CMOS devices for processing data outputted from the unit pixels, wherein a self-aligned silicide layer is formed on gate electrodes and source/drain regions of the CMOS devices in the logic region while a self-aligned silicide blocking layer is formed over the pixel region.
申请公布号 US7358552(B2) 申请公布日期 2008.04.15
申请号 US20050236047 申请日期 2005.09.26
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 LEE JU-IL
分类号 H01L31/062;H01L21/8238;H01L27/092;H01L27/146;H04N5/335;H04N5/357;H04N5/369;H04N5/374 主分类号 H01L31/062
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