发明名称 TEST RESULT MARKING OF ELECTRONIC PACKAGES
摘要 A number of electronic die are attached to an interconnect structure (e.g., a lead frame, a substrate, a panel, or a strip). The die are encapsulated to provide a number of unsingulated packages of an overall package assembly. The unsingulated packages are then tested, and test results for each package are automatically marked on encapsulant corresponding to the package. The packages are then singulated after the automated machine marking, and sorted according to the markings.
申请公布号 WO2005070178(A2) 申请公布日期 2005.08.04
申请号 WO2005US00941 申请日期 2005.01.12
申请人 FREESCALE SEMICONDUCTOR, INC.;COCHRAN, PATRICK, B.;BAI, ZHI-GANG;CAO, LU-XIN;CHOW, WAI WONG;KOVAR, GARY, J. 发明人 COCHRAN, PATRICK, B.;BAI, ZHI-GANG;CAO, LU-XIN;CHOW, WAI WONG;KOVAR, GARY, J.
分类号 G01R31/28;H01L21/50;H01L21/66;H01L23/544 主分类号 G01R31/28
代理机构 代理人
主权项
地址