发明名称 |
Semiconductor device including a support structure |
摘要 |
In a semiconductor device, a support wall is formed between storage nodes to more effectively prevent leaning of a capacitor, and the storage nodes are formed using a damascene process, which may increase a contact area between each storage node and a storage node contact. |
申请公布号 |
US9362421(B2) |
申请公布日期 |
2016.06.07 |
申请号 |
US201213679445 |
申请日期 |
2012.11.16 |
申请人 |
SK HYNIX INC. |
发明人 |
Park Cheol Hwan;Kim Dong Sauk |
分类号 |
H01L29/92;H01L27/108;H01L49/02 |
主分类号 |
H01L29/92 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a first storage node; a second storage node spaced apart from and next to the first storage node along a first direction; a third storage node spaced apart from and next to the first storage node along a second direction crossing the first direction, the first, second and third storage nodes being included in a plurality of storage nodes; a support wall located between the first storage node and the third storage node so as to contact the first storage node and the second storage node; and a dielectric layer and a plate electrode disposed in a storage node region, and in a space between the first and second storage nodes, wherein the plurality of storage nodes, the dielectric layer and the plate electrode are elements of a capacitor. |
地址 |
Icheon KR |