发明名称 MONITORING SEMICONDUCTOR DEVICE, METHOD FOR PERFORMING DEEP N-TYPED WELL-CORRELATED (DNW-CORRELATED) ANTENNA RULE CHECK OF INTEGRATED CIRCUIT AND SEMICONDUCTOR STRUCTURE COMPLYING WITH DNW-CORRELATED ANTENNA RULE
摘要 A semiconductor monitoring device includes a substrate, a die seal ring formed on the substrate, a deep n-typed well formed in the substrate under the die seal ring, and a monitoring device electrically connected to the die seal ring. The monitoring device is formed in a scribe line region defined on the substrate. A width of the deep n-typed well is larger than a width of the die seal ring.
申请公布号 US2016211187(A1) 申请公布日期 2016.07.21
申请号 US201514598236 申请日期 2015.01.16
申请人 UNITED MICROELECTRONICS CORP. 发明人 Zhang Xing Hua;Ku Chi-Fa;Liao Hong;Li Ye Chao;Yang Hui
分类号 H01L21/66;H01L23/10;H01L23/528;G06F17/50 主分类号 H01L21/66
代理机构 代理人
主权项 1. A semiconductor monitoring device comprising: a substrate; a die seal ring formed on the substrate; a deep n-typed well formed in the substrate under the die seal ring; and a monitoring device electrically connected to the die seal ring.
地址 Hsin-Chu City TW