发明名称 LIGHT ENHANCEMENT ELEMENT AND ANALYZER
摘要 PROBLEM TO BE SOLVED: To provide a light enhancement element and an analyzer which efficiently generate surface-enhanced Raman scattering (SERS).SOLUTION: A light enhancement element 10 includes a base plate 100, a recess 110, a metal film 120, a particulate 130, and a gap 114. The recess 110 is formed on a first surface 102 of the base plate 100. The metal film 120 is formed on an inner wall 112 of the recess 110. The particulate 130 is fitted into the recess 110. At least a surface of the particulate 130 is made of metal or a metal oxide. The gap 114 is formed at least in a partial region between the metal film 120 and the particulate 130.SELECTED DRAWING: Figure 1
申请公布号 JP2016121933(A) 申请公布日期 2016.07.07
申请号 JP20140261807 申请日期 2014.12.25
申请人 FUJI ELECTRIC CO LTD;UNIV OF TOKYO 发明人 ANAMIZAKI MINORU;TAKEI MASAHIKO;JEAN JACQUES DELAUNAY;LEE YAERIM
分类号 G01N21/65 主分类号 G01N21/65
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