发明名称 MEASURING APPARATUS OF THREE-DIMENSIONAL POSITION
摘要 PURPOSE:To enable the highly-precise measurement of a three-dimensional position, by a method wherein first and second cameras picking up an object from different directions are oscillated at a prescribed frequency and signals from the cameras are subjected to waveform processing. CONSTITUTION:A first camera 1 and a second camera 2 pickup and object 3 of measurement from different directions. The first and second cameras 1 and 2 are rotated first and second actuators 5 and 6 as shown by arrows respectively, being rotated normally and reversely in the shape of a sine wave. Then, output signals from the first and second cameras 1 and 2 are obtained also in the shape of the sine wave. When a nose of a short frequency, such as a thermal noise, is superposed on the outputted sine-wave-shaped signal, processing is made by a waveform processing means 7 so that only a signal having the same frequency with that obtained when the cameras 1 and 2 are moved can be taken out, and thereby the noise having a different frequency is removed. Signals wherefrom the noise is removed are inputted to an arithmetic processing system 4, the position of the object 3 represented by space coordinates can be obtained therein, and thus a highly-precise three-dimensional position measuring apparatus can be obtained.
申请公布号 JPS63212815(A) 申请公布日期 1988.09.05
申请号 JP19870047165 申请日期 1987.03.02
申请人 MITSUBISHI ELECTRIC CORP 发明人 MASUDA TAKAHIRO
分类号 G01C15/00;G01B11/00 主分类号 G01C15/00
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