发明名称 Machine for mechanically testing a specimen under a high thermal flux
摘要 <p>The equipment comprises a housing for the test piece (E) and means of applying mechanical pressure (1), shutters to control the heating (2) and a heat source (3). The test piece (E) is located in a sleeve (9) at the back of a chamber screened by a quartz window. Pressure is applied to the rear surface of the test piece by a piston (25) driven through a pressure sensor and a spring to ensure accurate control. Heat directed to the test piece is controlled by shutters (2) which have cut outs to fit the beams of incoming radiation and cooling channels (57) to control the temperature. The heat is applied typically by three xenon 7 kW lamps able to heat the test piece to about 3000 degrees C.</p>
申请公布号 EP0838675(A1) 申请公布日期 1998.04.29
申请号 EP19970402477 申请日期 1997.10.20
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE 发明人 MAQUIN, JEAN-MARIE;CASTALDI, MARC;FORT, CHRISTIAN
分类号 G01N3/08;G01N3/60;(IPC1-7):G01N3/60 主分类号 G01N3/08
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