| 发明名称 | Meter data management testing | ||
| 摘要 | Examples of meter data management testing are disclosed. In one example implementation according to aspects of the present disclosure, a computing device may include one or more processors, a memory for storing machine readable instructions, and a data store. The computing device may further include a meter data management testing module stored in the memory and executing on at least one of the one or more processors to test a meter data management system using a data set of representative metering data and a user-generated test scenario specifying a plurality of metering parameters. | ||
| 申请公布号 | US9466087(B2) | 申请公布日期 | 2016.10.11 |
| 申请号 | US201313912344 | 申请日期 | 2013.06.07 |
| 申请人 | Hewlett Packard Enterprise Development LP | 发明人 | Arlitt Martin;Marwah Manish;Shah Amip J. |
| 分类号 | G01D21/00;G06Q50/06;G06Q10/00;G01D4/00 | 主分类号 | G01D21/00 |
| 代理机构 | Hewlett Packard Enterprise Patent Department | 代理人 | Hewlett Packard Enterprise Patent Department |
| 主权项 | 1. A computing device comprising: one or more processors; a memory for storing machine readable instructions; a data store; a meter data management testing module stored in the memory and executing on at least one of the one or more processors to test a meter data management system using a data set of representative metering data and a user-generated test scenario specifying a plurality of metering parameters, wherein the representative metering data is associated with utility usage data of an advanced meter infrastructure (AMI), andwherein the test generates test data of the meter data management system; and a synthetic data generator module stored in the memory and executing on at least one of the one or more processors to generate a synthetic data set of representative metering data to be used by the meter data management testing module. | ||
| 地址 | Houston TX US | ||